Quantifying Intermodulation Distortion in Dual-Frequency Megasonic Cleaning

Quantifying Intermodulation Distortion in Dual-Frequency Megasonic Cleaning

Presented by Nicolas Candia from Onda at SPIE BACUS, this collaborative study introduces a novel cavitation measurement method for dual-frequency megasonic mask cleaning. Quantifying intermodulation distortion in a Sonosys system proves the technique increases stable cavitation, highlighting process benefits for Micron.

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